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Difference Between AFM and SEM

July 2, 2011Posted byAdmin

AFM vs SEM Need to explore the smaller world, has been rapidly growing with the recent development of new technologies such as nanotechnology, microbiology and electronics. Since microscope is the tool which provides the magnified images of the smaller objects, a lot of research is done on developing different techniques of microscopy to increase the […]

Filed Under:TechnologyTagged With:AFM,Atomic Force Microscope,Christoph Gerber,Gerd Binnig,high resolution microscopes,Max Knoll,显微镜,microscopy,nanometer resolution,nanotechnology,Scanning Electron Microscope,SEM

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